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Distinction between six- and fourfold coordinated silicon in SiO2 polymorphs via electron loss near edge structure (ELNES) spectroscopy; 1 [Score: 100%]
Author / Editor: Sharp, T.; Seifert, Friedrich | Place of publication: Berlin | Publisher: Springer | Year of Publication: 1996 | 8 s.
Journal / Series / Collection: Physics and chemistry of minerals; 23
Subject Area: Chemie und Pharmazie; Physik

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