Exzellenzportal der Leibnizpreisträger der Deutschen Forschungsgemeinschaft
Homepage
Search
Project
Participating prize winners
Partners
Subject Areas
Contact
Help
Imprint
Privacy Policy
Accessibility
A
A
A
Back to result list
Search within document
Semiconductor Applications in Metrology
Author / Editor
: Göbel, Ernst O.
Place of publication
: Braunschweig/Wiesbaden |
Year of Publication
: 1999 |
Publisher
: Vieweg
Call number
: Augsburg, Universitätsbibliothek -- 85 UA 4020-39#S.1-12
[Search within document]
[PDF-Download]
50%
100%
150%
-10
-5
-1
Scan
+1
+5
+10
50%
100%
150%
-10
-5
-1
Scan
+1
+5
+10