Distinction between six- and fourfold coordinated silicon in SiO2 polymorphs via electron loss near edge structure (ELNES) spectroscopy
Author / Editor: Sharp, T. ; Seifert, Friedrich
Author / Editor: Sharp, T. ; Seifert, Friedrich
Place of publication:
Berlin |
Year of Publication:
1996 |
Publisher:
Springer
Call number: Z 77.602-23#S.17-24
Call number: Z 77.602-23#S.17-24
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