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2 hits in 0.006 sec.

Electromigration failure by shape change of voids in bamboo lines; 17 [Score: 100%]
Author / Editor: Arzt, Eduard |  Place of publication: Woodbury, NY |  Publisher: American Institute of Physics |  Year of Publication: 1994 | 9 s.
Journal / Series / Collection: Journal of applied physics; 104
Subject Area: Physik
A comparative ab initio study of the Si2C4, Si3C3, Si4C2 clusters; 8 [Score: 100%]
Author / Editor: Froudakis, Georgios; Peyerimhoff, Sigrid |  Place of publication: Woodbury, NY |  Publisher: American Institute of Physics |  Year of Publication: 1994 | 10 s.
Journal / Series / Collection: The journal of chemical physics; 101
Subject Area: Chemie und Pharmazie

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